Meet the Park FX 40 AFM: an atomic force microscope that automates set up and scanning tasks. It lets you place several samples to have them imaged autonomously. The Park FX40 can replace its own tips with the click of a button to avoid contamination errors. It also comes with auto probe reading and beam alignment.
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The FX40 uses machine learning to detect whether probes are correctly positioned. It uses a smart vision system to locate the position of a loaded probe to a nano level. There are also sensors available to measure temperature, humidity, leveling and vibration.
[HT]
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